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GD-OES (Glow Discharge Optical Emission Spectrometer) is an analyzer for rapid and precise elemental depth profile analysis of solid materials by sputtering atoms from the sample surface and analyzing the OES emitted light.
GD-OES is a robust, decades proven powerful technique for analyzing the elemental composition of solid materials, advantaging the gradient compositional chemistry and the depth profiling of multiple layers.
For any solid material, get trace-level quantitative results for the full periodic table, from lithium to uranium.
Surface analysis, layers, characterize coatings or chemically diagnose failures with nanoscale depth profiling.
create maps with micron-scale resolution to investigate how elements change spatially, and much more.
Identify an unknown material or detect contaminants within minutes for the lowest cost and the simplicity of just "load and click".